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ADM1166
Monitoring Fault Detector
The monitoring fault detector block is used to detect a failure
on an input. The logical function implementing this is a wide
OR gate that can detect when an input deviates from its expected
condition. The clearest demonstration of the use of this block is
in the PWRGD state, where the monitor block indicates that a
failure on one or more of the VPx, VXx, or VH inputs has
occurred.
No programmable delay is available in this block because the
triggering of a fault condition is likely to be caused by a supply
falling out of tolerance. In this situation, the device must react
as quickly as possible. Some latency occurs when moving out of
this state because it takes a finite amount of time (~20 μs) for the
state configuration to download from the EEPROM into the SE.
Figure 29 is a block diagram of the monitoring fault detector.
MONITORING FAULT
DETECTOR
1-BIT FAULT
Timeout Detector
The timeout detector allows the user to trap a failure to ensure
proper progress through a power-up or power-down sequence.
In the sample application shown in Figure 28, the timeout next-
state transition is from the EN3V3 and EN2V5 states. For the
EN3V3 state, the signal 3V3ON is asserted on the PDO1 output
pin upon entry to this state to turn on a 3.3 V supply.
This supply rail is connected to the VP2 pin, and the sequence
detector looks for the VP2 pin to go above its undervoltage
threshold, which is set in the supply fault detector (SFD)
attached to that pin.
The power-up sequence progresses when this change is detected. If,
however, the supply fails (perhaps due to a short circuit overloading
this supply), the timeout block traps the problem. In this example,
if the 3.3 V supply fails within 10 ms, the SE moves to the DIS3V3
state and turns off this supply by bringing PDO1 low. It also
indicates that a fault has occurred by taking PDO3 high. Timeout
VP1
SUPPLY FAULT
DETECTION
DETECTOR
FAULT
delays of 100 μs to 400 ms can be programmed.
FAULT AND STATUS REPORTING
MASK
SENSE
1-BIT FAULT
DETECTOR
The ADM1166 has a fault latch for recording faults. Two registers,
FSTAT1 and FSTAT2, are set aside for this purpose. A single bit
is assigned to each input of the device, and a fault on that input
sets the relevant bit. The contents of the fault register can be
VX5
LOGIC INPUT CHANGE
OR FAULT DETECTION
WARNINGS
FAULT
MASK
SENSE
1-BIT FAULT
DETECTOR
FAULT
read out over the SMBus to determine which input(s) faulted.
The fault register can be enabled or disabled in each state. To
latch data from one state, ensure that the fault latch is disabled
in the following state. This ensures that only real faults are
captured and not, for example, undervoltage conditions that
may be present during a power-up or power-down sequence.
The ADM1166 also has a number of input status registers. These
include more detailed information, such as whether an under-
MASK
Figure 29. Monitoring Fault Detector Block Diagram
voltage or overvoltage fault is present on a particular input. The
status registers also include information on ADC limit faults.
There are two sets of these registers with different behaviors.
The first set of status registers is not latched in any way and,
therefore, can change at any time in response to changes on the
inputs. These registers provide information as the UV and OV
state of the inputs, the digital state of the GPI VXx inputs, and
also the ADC warning limit status.
The second set of registers update each time the sequence engine
changes state and are latched until the next state change. The
second set of registers provides the same information as the first
set, but in a more compact form. The reason for this is that
these registers are used by the black box feature when writing
status information for the previous state into EEPROM.
See the AN-698 Application Note for full details about the
ADM1166 registers.
Rev. 0 | Page 19 of 32
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